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このアイテムの引用には次の識別子を使用してください:
http://hdl.handle.net/10119/16144
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タイトル: | Effect of evacuating a chamber on the degradation rate of solar cells in a cell-level potential-induced degradation test |
著者: | Yamaguchi, Seira Ohdaira, Keisuke |
発行日: | 2018-08-29 |
出版者: | IOP Publishing |
誌名: | Japanese Journal of Applied Physics |
巻: | 57 |
号: | 10 |
開始ページ: | 108002-1 |
終了ページ: | 108002-2 |
DOI: | 10.7567/JJAP.57.108002 |
抄録: | In this work, we investigated the effect of evacuating a chamber on the degradation rate of solar cells in a cell-level potential-induced degradation (PID) test by which photovoltaic-module-like stacks are stressed. The degradation rate of a solar cell tested in an evacuated chamber was higher than that in air. The higher degradation rate may be due to the improvement of contacts between the stack components. From this result, evacuating the chamber was confirmed to be effective for obtaining a high acceleration factor in cell-level PID tests. |
Rights: | This is the author's version of the work. It is posted here by permission of The Japan Society of Applied Physics. Copyright (C) 2018 The Japan Society of Applied Physics. Seira Yamaguchi and Keisuke Ohdaira, Japanese Journal of Applied Physics, 57(10), 2018, 108002. http://dx.doi.org/10.7567/JJAP.57.108002 |
URI: | http://hdl.handle.net/10119/16144 |
資料タイプ: | author |
出現コレクション: | c10-1. 雑誌掲載論文 (Journal Articles)
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記述 |
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3023.pdf | | 189Kb | Adobe PDF | 見る/開く |
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