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Master of Science（Materials Science） >
H12) (Jun.2000 - Mar.2001 >
Please use this identifier to cite or link to this item:
http://hdl.handle.net/10119/2770
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| Title: | Kelvin法による電荷移動型薄膜の評価 |
| Authors: | 平林, 修 |
| Authors(alternative): | ひらばやし, おさむ |
| Keywords: | ケルビンプローブ、電荷移動錯体、中性イオン性相転移
Kelvin Probe,Charge transfer complex,N-I phase tra |
| Issue Date: | Mar-2001 |
| Description: |
Supervisor:三谷 忠興
材料科学研究科
修士 |
| Title(English): | Charge transfer type thin film studied by Kelvin Probe |
| Authors(English): | Hirabayasi, Osamu |
| Language: | jpn |
| URI: | http://hdl.handle.net/10119/2770 |
| Appears in Collections: | M-MS. 2000年度(H12) (Jun.2000 - Mar.2001)
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Files in This Item:
| File |
Description |
Size | Format |
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| 1399abstract.pdf | | 275Kb | Adobe PDF | View/Open |
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