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Master of Science（Materials Science） >
H17) (Jun.2005 - Mar.2006 >
Please use this identifier to cite or link to this item:
https://hdl.handle.net/10119/3228
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| Title: | X線反射率測定によるポリヘキシルチオフェン超薄膜の構造評価 |
| Authors: | 黒澤, 剛志 |
| Authors(alternative): | くろさわ, つよし |
| Keywords: | ポリヘキシルチオフェン，超薄膜, X線反射率
polyhexylthiophene, ultra-thin film, X-ray reflect |
| Issue Date: | Mar-2006 |
| Description: |
Supervisor:佐々木 伸太郎教授
材料科学研究科
修士 |
| Title(English): | Structural evaluation of polyhexylthiophene ultra-thin films by X-ray reflectivity measurements |
| Authors(English): | Kurosawa, Tsuyoshi |
| Language: | eng |
| URI: | https://hdl.handle.net/10119/3228 |
| Appears in Collections: | M-MS. 2005年度(H17) (Jun.2005 - Mar.2006)
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Files in This Item:
| File |
Description |
Size | Format |
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| 2873abstract.pdf | | 183Kb | Adobe PDF | View/Open |
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