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Please use this identifier to cite or link to this item: https://hdl.handle.net/10119/3886

Title: Psychometric Evaluation with Correlation for Multiple Perceptions
Authors: Hayashi, Hidehiko
Nakagawa, Masao
Nakayasu, Hidetoshi
Keywords: Human performance
Joint probability
Bivariate normal distribution
Intelligent visual inspection
Detection threshold for attribute of image data
Issue Date: Nov-2005
Publisher: JAIST Press
Abstract: In this paper, we propose a new method for improving detection probabilities of the defect inspection in quality control on the FRP product surface. Our proposed method has improved the detection probabilities by using the joint probabilities of dual attributes with correlation for multiple perceptions. In order to obtain the improving detection probability, three kinds of attributes such as size, aspect ratio, and color density are prepared in experiments. The experiments were performed by the paired comparison under constant stimuli. The result of our experiment qualitatively shows that the improving ratio of detection probabilities for dual attributes:P12, P23, P31 respectively rise approximately 21%, 26% and 24% for the mean in the case of dual attributes experiments. In addition, detection probabilities to be obtained by our method for multiple perceptions such as using dual attributes experiment were improved approximately 28% in comparison with the detection probability of past single attribute. These results showed our method was effective in rising detection probability for multiple perceptions.
Description: The original publication is available at JAIST Press http://www.jaist.ac.jp/library/jaist-press/index.html
IFSR 2005 : Proceedings of the First World Congress of the International Federation for Systems Research : The New Roles of Systems Sciences For a Knowledge-based Society : Nov. 14-17, 2096, Kobe, Japan
Symposium 3, Session 5 : Intelligent Information Technology and Applications Evaluation and Standard
Language: ENG
URI: https://hdl.handle.net/10119/3886
ISBN: 4-903092-02-X
Appears in Collections:IFSR 2005

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