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http://hdl.handle.net/10119/4499
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Title: | Azimuthal angle dependence of optical second harmonic intensity from a vicinal GaAs(001) wafer |
Authors: | Takebayashi, Motonari Mizutani, Goro Ushioda, Sukekatsu |
Keywords: | optical second harmonic generation SHG vicinal GaAs(001) tilt angle surface nonlinearity |
Issue Date: | 1997-01-01 |
Publisher: | Elsevier |
Magazine name: | Optics Communications |
Volume: | 133 |
Number: | 1-6 |
Start page: | 116 |
End page: | 122 |
DOI: | 10.1016/S0030-4018(96)00491-9 |
Abstract: | We demonstrate that the tilt angle of a zinc blende type single crystal (001) wafer can be measured by optical second harmonic generation. The SH intensity patterns were analyzed for all four combinations of p- and s-polarized incidence and output, considering both the bulk and surface optical nonlinearities in the electric dipole approximation. We found that the measurement using s-incident polarization is particularly useful in determining the tilt angle of the crystal axes. The parameters determined by the present method agree well with those obtained by X-ray diffraction measurements. The [110] and [110] directions can be distinguished through the analysis of the p-incident and p-output SH intensity patterns. |
Rights: | NOTICE: This is the author's version of a work accepted for publication by Elsevier. M. Takebayashi, G. Mizutani, and S. Ushioda, Optics Communications, 133(1-6), 1997, 116-122, http://dx.doi.org/10.1016/S0030-4018(96)00491-9 |
URI: | http://hdl.handle.net/10119/4499 |
Material Type: | author |
Appears in Collections: | c10-1. 雑誌掲載論文 (Journal Articles)
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