|
JAIST Repository >
School of Materials Science >
Articles >
Journal Articles >
Please use this identifier to cite or link to this item:
https://hdl.handle.net/10119/4499
|
| Title: | Azimuthal angle dependence of optical second harmonic intensity from a vicinal GaAs(001) wafer |
| Authors: | Takebayashi, Motonari
Mizutani, Goro
Ushioda, Sukekatsu |
| Keywords: | optical second harmonic generation
SHG
vicinal GaAs(001)
tilt angle
surface nonlinearity |
| Issue Date: | 1997-01-01 |
| Publisher: | Elsevier |
| Magazine name: | Optics Communications |
| Volume: | 133 |
| Number: | 1-6 |
| Start page: | 116 |
| End page: | 122 |
| DOI: | 10.1016/S0030-4018(96)00491-9 |
| Abstract: | We demonstrate that the tilt angle of a zinc blende type single crystal (001) wafer can be measured by optical second harmonic generation. The SH intensity patterns were analyzed for all four combinations of p- and s-polarized incidence and output, considering both the bulk and surface optical nonlinearities in the electric dipole approximation. We found that the measurement using s-incident polarization is particularly useful in determining the tilt angle of the crystal axes. The parameters determined by the present method agree well with those obtained by X-ray diffraction measurements. The [110] and [110] directions can be distinguished through the analysis of the p-incident and p-output SH intensity patterns. |
| Rights: | NOTICE: This is the author's version of a work accepted for publication by Elsevier. M. Takebayashi, G. Mizutani, and S. Ushioda, Optics Communications, 133(1-6), 1997, 116-122, http://dx.doi.org/10.1016/S0030-4018(96)00491-9 |
| URI: | https://hdl.handle.net/10119/4499 |
| Material Type: | author |
| Appears in Collections: | c10-1. 雑誌掲載論文 (Journal Articles)
|
Files in This Item:
| File |
Description |
Size | Format |
|---|
| 120-13.pdf | | 606Kb | Adobe PDF | View/Open |
|
All items in DSpace are protected by copyright, with all rights reserved.
|
