16 著者名表示.
発行日 | タイトル |
著者 |
1996 | 超高真空STMで安定な原子像を得るためには?-試作と実験のノウハウ (II)- | 富取, 正彦; Tomitori, Masahiko |
May-1996 | 超高真空STMで安定な原子像を得るためには?-試作と実験のノウハウ (I)- | 富取, 正彦; Tomitori, Masahiko |
Jul-2004 | Germanium nanostructures on silicon observed by scanning probe microscopy | Tomitori, Masahiko; Arai, Toyoko |
8-Feb-2005 | A Si nanopillar grown on a Si tip by atomic force microscopy in ultrahigh vacuum for a high-quality scanning probe | Arai, Toyoko; Tomitori, Masahiko |
25-Apr-2006 | Evidence of temperature dependence of initial adsorption sites of Ge atoms on Si(111)-7x7 | Ansari, Zubaida A.; Tomitori, Masahiko; Arai, Toyoko |
2008 | 走査型プローブ顕微鏡にみる電圧印加のナノ力学的相互作用 | 富取, 正彦; 新井, 豊子; Tomitori, Masahiko; Arai, Toyoko |
28-May-2010 | Frequency modulation atomic force microscope observation of TiO_2(110) surfaces in water | Sasahara, Akira; Tomitori, Masahiko |
4-Jun-2012 | 電圧印加非接触原子間力顕微鏡/分光法による固体表面間の結合形成過程の解析 | 富取, 正彦; Tomitori, Masahiko |
3-Jun-2013 | 複合顕微鏡による高温下でのナノ接点・接合形成のその場観察・解析 | 富取, 正彦; Tomitori, Masahiko |
13-Aug-2013 | Electrochemical etching of metal wires in low-stress electric contact using a liquid metal electrode to fabricate tips for scanning tunneling microscopy | Nishimura, Takashi; Amer Hassan, Amer Mahmoud; Tomitori, Masahiko |
23-Jul-2014 | Stable alignment of 4,4″-diamino-p-terphenyl chemically adsorbed on a Si(001)-(2 × 1) surface observed by scanning tunneling microscopy | Amer Hassan, Amer Mahmoud; Nishimura, Takashi; Sasahara, Akira; Murata, Hideyuki; Tomitori, Masahiko |
30-Jul-2014 | Resonance frequency-retuned quartz tuning fork as a force sensor for noncontact atomic force microscopy | Ooe, Hiroaki; Sakuishi, Tatsuya; Nogami, Makoto; Tomitori, Masahiko; Arai, Toyoko |
3-Jun-2016 | 走査型プローブ顕微鏡技術を利用したナノ接合界面の形成と解析 | 富取, 正彦; Tomitori, Masahiko |
2-Jun-2017 | 走査型プローブ顕微鏡を応用した固体表面上1分子の電荷状態変化の測定 | 富取, 正彦; Tomitori, Masahiko |
22-Jun-2017 | Quasi-stabilized hydration layers on muscovite mica under a thin water film grown from humid air | Arai, Toyoko; Sato, Kohei; Iida, Asuka; Tomitori, Masahiko |
19-Mar-2018 | Energy dissipation unveils atomic displacement in the noncontact atomic force microscopy imaging of Si(111)-(7×7) | Arai, Toyoko; Inamura, Ryo; Kura, Daiki; Tomitori, Masahiko |