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このアイテムの引用には次の識別子を使用してください:
http://hdl.handle.net/10119/8480
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| タイトル: | On the derivation of a minimum test set in high quality transition testing |
| 著者: | Iwagaki, Tsuyoshi
Kaneko, Mineo |
| 発行日: | 2009-03 |
| 出版者: | Institute of Electrical and Electronics Engineers (IEEE) |
| 誌名: | 10th Latin American Test Workshop, 2009. LATW '09. |
| 開始ページ: | 1 |
| 終了ページ: | 6 |
| DOI: | 10.1109/LATW.2009.4813784 |
| 抄録: | This paper discusses a test generation method to derive high quality transition tests for combinational circuits. It is known that, for a transition fault, a test set which propagates the errors (late transitions) to all the primary outputs reachable from the fault site can enhance the detectability of unmodeled defects. In this paper, to generate a minimum test set that meets the above property, the test generation problem is formulated as a problem of integer linear programming. The proposed formulation guarantees that minimum two-pattern tests for a transition fault are generated so that the errors will be observed at all the primary outputs reachable from the fault site. A case study using a benchmark circuit is presented to show the feasibility of the proposed method. |
| Rights: | Copyright (C) 2009 IEEE. Reprinted from 10th Latin American Test Workshop, 2009. LATW '09., 1-6. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of JAIST's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it. |
| URI: | http://hdl.handle.net/10119/8480 |
| 資料タイプ: | publisher |
| 出現コレクション: | b11-1. 会議発表論文・発表資料 (Conference Papers)
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このアイテムのファイル:
| ファイル |
記述 |
サイズ | 形式 |
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| A13607.pdf | | 1411Kb | Adobe PDF | 見る/開く |
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